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C Hi-Tester (120Hz & 1kHz) w/GP-IB Binning
C Hi-Tester (120Hz & 1kHz) w/GP-IB Binning
Product Highlights- Constant voltage measurement (1V or 500mV)
- Minimum measurement time of 2 ms
- Comparator function BIN function (Max. 14 rank)
- Memory for 99 sets of measurement conditions
- Simple operations that are easy to use plus LED indication
- Trigger-synchronous output function
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